Normal view MARC view ISBD view

Semiconductor Memories : Testing And Reliability

Sharma, Ashok K.

Semiconductor Memories : Testing And Reliability - Delhi Willey 2014 - 460p

ISBN: 9788126548378

Nat. Bib. No.: 9788126548378

Subjects--Topical Terms:
MATHEMATICS

Dewey Class. No.: 621.397 SHA

Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)